Publications : Prof WD Roos

Conferences / Konferensies

CONRADIE, R., SWART , H.C., ROOS, W.D. Room temperature oxidation of segregated Mo and N on an Fe(100)-3.5at%Mo-N specimen. 46th Annual Conference of the South African Institute of Physics, University of Natal, Durban, 2001.

CONRADIE, R., SWART , H.C., ROOS, W.D. Determining the thickness of an oxide layer on Fe(100)-Mo-N using Auger electron spectroscopy. 46th Annual Conference of the South African Institute of Physics, University of Natal, Durban, 2001.

ASANTE, J.K.O., ROOS, W.D., TERBLANS, J.J. A mathematical fit procedure to determine segregation parameters from experimental data of a linear temperature run. 46th Annual Conference of the South African Institute of Physics, University of Natal, Durban, 2001.

JONKER, A.J., CLAASSENS, C.H., CHEN, R., VENTER, L.A., RAMOSHEBE, P., WURTH, E., TERBLANS, J.J., ROOS, W.D., SWART, H.C. AES-study on TiC thin films to determine Interdiffusion Parameters. 47th Annual Conference of the South African Institute of Physics, Potchefstroom, S.A., 2002.

CONRADIE, R., ROOS, W.D., GREYLING, C.J., SWART, H.C. Phosphated Electrogalvanised Steel: Investigating White Spotting. 47th Annual Conference of the South African Institute of Physics, Potchefstroom, S.A., 2002.

NTWAEABORWA, O.M., VAN WYK, G.N., ROOS, W.D., TERBLANS, J.J. GREEFF, A.P., SWART, H.C. All systems go at Kovsies. 47th Annual Conference of the South African Institute of Physics, Potchefstroom, S.A., 2002.

ASANTE, J.K.O., ROOS W.D., TERBLANS, J.J. A reliable method for finding the equilibrium segregation parameters in a ternary system. 47th Annual Conference of the South African Institute of Physics, Potchefstroom, S.A., 2002.

ASANTE, J.K.O., TERBLANS, J.J., ROOS, W.D. Finding the equilibrium segregation parameters in a Cu(111),Sn,Sb ternary system, Proceedings of the 4th International Workshop on Surface and Interface Segregation 6 – 7.

OLIVIER, G.J., TERBLANS, J.J., ROOS, W.D. The darken surface segregation simulation of a ternary copper-silver-antimony alloy, 48th Annual Conference of the South African Institute of Physics, Stellenbosch, S.A., 2003.

ASANTE, J.K.O., ROOS, W.D., TERBLANS, J.J. Segregation parameters in a (111)Cu,Sn,Sb crystal from constant temperature runs, 48th Annual Conference of the South African Institute of Physics, Stellenbosch, S.A., 2003.

DIALE, M., AURET, F.D., VAN DER BERG, N.G., ROOS, W.D. A surface analytical study of GaN cleaning procedures, 48th Annual Conference of the South African Institute of Physics, Stellenbosch, S.A., 2003.

TESFAMICAEL, B.Y., ROOS, W.D., TERBLANS, J.J., SWART, H.C., WANG, J.Y. Determination of the interdiffusion parameters in Cu/Ni thin films by Auger sputter depth profiling. 49th Annual Conference of the South African Institute of Physics, Bloemfontein, S.A., 2004.

Journals (accredited) / Navorsingstydskrifte (geakkrediteerde)

VAN WYK, G.N., ROOS, W.D. Silicon diffusion in an Fe-based amorphous alloy Surface Science, 1986. 26: 317

ROOS, W.D., VAN WYK, G.N., DU PLESSIS, J. Diffusion of silicon in Fe-based amorphous and crystalline alloys Applied Surface Science, 1990. 40: 303

VAN WYK, G.N., PRIGGEMEYER, S., ROOS, W.D., HEILAND, W. The diffusion behaviour of Pb in yytrium iron gernat films Applied Surface Science, 1991. 52: 351

VAN WYK, G.N., PRIGGEMEYER, S., ROOS, W.D., HEILAND, W. The diffusion behaviour of Pb in yttrium iron garnet films Applied Surface Science, 1991. 52: 351

ROOS, W.D., VAN WYK, G.N. The influence of Si on the oxidation of Fe0based amorphous alloys Journal of Materials Science, 1992. 27: 1193

BERNING, G.L.P., SWART, H.C., ROOS, W.D. The oxidation of terbium silicide Applied Surface Science, 1993. 73: 305

ROOS, W.D., HENSON, R.P., VAN WYK, G.N. A voltage control unit for ion scattering spectroscopy analyzers Rev. Sci. Instrum., 1993. 64(4): 966

ROOS, W.D., VAN WYK, G.N., DU PLESSIS, J. Use of AES to determine sputter-induced concentration profiles in Cu-Ni alloys Surface and Interface Analysis, 1993. 20: 95

VAN WYK, G.N., ROOS, W.D., DU PLESSIS, J., TAGLAUER, E. Sputter induced concentration profiles in binary alloys Inst. Conf. Ser., 1993. 130. Chapter 6: 435

VAN WYK, G.N., ROOS, W.D., DU PLESSIS, J., TAGLAUER, E. Sputter-induced concentration profiles in binary alloys Inst. Phys. Conf. Ser., 1993. 130 Chapter 6: 435

ROOS, W.D., VAN WYK, G.N., DU PLESSIS, J. Weight function for linear least squares fit of binary CuNi and PtPd alloy auger spectra Surface and Interface Analysis, 1994. 22: 65-68

ROOS, W.D., DU PLESSIS, J., VAN WYK, G.N., TAGLAUER E., WOLF, S. Surface structure and composition of NiAl(100) by low-energy ion scattering. Journal of Vacuum Science and Technology A, 1996. 14/3: 1648

VILJOEN, P.E., ROOS, W.D., SWART, H.C., HOLLOWAY, P.H.. Carbon Auger peak shape measurements in the characterization of reactions on (001) diamond Applied Surface Science, 1996. 100/101: 612

BERNING, G.L.P., SWART, H.C., ROOS, W.D., DE WITT, B. ISS and AES studies of the initial oxidation of Dy, Tb, and their silicides Materials Chemistry and Physics, 1999. 58: 26-30

ABRAMS, B.L., ROOS, W.D., HOLLOWAY, P.H., SWART, H.C. Electron beam induced degradation of Zinc sulfide-based phosphors Surface Science, 2000. 451: 174-181

HILLIE, K.T., SWART, H.C., ROOS, W.D. On the degradation of ZnS:Cu,Al,Au phosphor powder: The effects of temperature. Radiation Effects and Defects in Solids 2001, (154) 373-376

CONRADIE, R., ROOS, W.D., SWART, H.C. The room temperature oxidation of Fe(100), Fe(100)-3.5wt % Mo-N and segregated MoN: A mathematical analysis. Surface. Interface Analysis 2002; 33 (8): 704-719.

CONRADIE, R., ROOS, W.D., SWART, H.C. The influence of a segregated MoN layer on the room temperature oxidation of a Fe(100)-3.5wt % Mo-N specimen. Corrosion Science 2003; 45(2): 339-351.

SWART., H.C., JONKER, A.J., CLAASSENS, C.H., CHEN, R., VENTER, L.A., RAMOSHEBE, P., WURTH, E., TERBLANS, J.J., ROOS, W.D. Extracting inter-diffusion parameters of TiC from AES depth profiles. Applied Surface Science 2003; 205(1 – 4): 231-239.

ASANTE, J.K.O., ROOS, W.D., MARITZ, M.F. Quantification from overlapping Auger peak-to-peak heights. Surface and Interface Analysis 2001; 31: 856-861.

ASANTE, J.K.O., ROOS, W.D., TERBLANS, J.J. Sequential segregation of Sn and Sb in a Cu(111) single crystal. Surface and Interface Analysis, 2003, 35: 441-444.

SWART, H.C., ROOS, W.D., TERBLANS, J.J. Surface segregating kinetics in a ternary system, Surface and Interface Analysis 2004; 36: 285-289.